About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.
As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...
The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
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