The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
BEAVERTON, Ore., Sept. 16, 2021 /PRNewswire/ -- Tektronix, Inc., a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series ...
(NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, today announced the launch of Omnyx, a groundbreaking manufacturing test platform for printed circuit board ...
Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...
Tektronix, Inc., a leading worldwide provider of test and measurement solutions, released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements. The S530 ...
A next-generation board-test system combines structural, parametric, high-speed interconnect, and functional testing to address the growing complexity of AI and data-centre hardware manufacturing.
October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...
To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results