Optical surface defect inspection and imaging techniques are pivotal to ensuring high-performance outcomes across a myriad of applications including semiconductor manufacturing, precision optics, and ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade detection, and drive long-term reliability failures.

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Topology originated from the classification of geometric structures in mathematics, and have prevailed in a variety of branches of physics, ranging from the early electronic topological insulator to ...

A team of physicists at the University of Cambridge has unveiled a breakthrough in quantum sensing by demonstrating the use of spin defects in hexagonal boron nitride (hBN) as powerful, ...