ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

In this paper a method for dynamic fault injection and fault simulation as well as its application to MEMS based sensor systems is described. The prerequisite for this approach is the availability of ...

Researchers at the Department of Energy’s Oak Ridge National Laboratory are leading the way in understanding the effects of electrical faults in the modern U.S. power grid. Faults are abnormal ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

Industrial simulation and emulation are powerful but still underemployed techniques for designing, developing, and testing better automation solutions and machines. When used as a central part of a ...

Several aspects must be taken into account when dealing with power electronic design. Within a system we can identify different elements such as thermal dissipation, electrical characteristics, ...